Titlebook: Springer Handbook of Microscopy; Peter W. Hawkes,John C. H. Spence Book 2019 Springer Nature Switzerland AG 2019 scanning electron microsc

同步左右

灾难

NEXUS

Scanning Electron MicroscopyThe theory section begins with the basics of image formation followed by an explanation of the interaction of the electron beam with the sample. A description of the different types of electron guns is also included. The concepts involved with image formation from a rastered (or scanned) electron be

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Variable Pressure Scanning Electron Microscopyrts. As the physics of electron–solid interactions are central to understanding the operation of these instruments and optimal selection of operating parameters, an introduction to that topic is provided. That section is divided into high-energy interactions, covering scattering of electrons from th

FAR

Cpap155

High-Speed Electron Microscopyand measurements of complex, transient materials phenomena with high spatial and temporal resolutions. The development and advancement of the two categories of high-speed electron microscopy, each optimized for specific regimes of spatial and temporal resolutions—single-shot dynamic TEM () and strob

mortuary

LEEM, SPLEEM and SPELEEMon to spin-polarized low-energy electron microscopy (), and its combination with spectroscopic photoemission and low-energy electron microscopy (). Other imaging methods mentioned only briefly in the chapter include ultraviolet photoemission electron microscopy (), mirror electron microscopy (), low

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做方舟

ambivalence