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Titlebook: Springer Handbook of Microscopy; Peter W. Hawkes,John C. H. Spence Book 2019 Springer Nature Switzerland AG 2019 scanning electron microsc

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发表于 2025-3-21 17:59:17 | 显示全部楼层 |阅读模式
书目名称Springer Handbook of Microscopy
编辑Peter W. Hawkes,John C. H. Spence
视频video
概述Comprehensively covers the fundamentals, instrumentation and applications of modern microscopy techniques.Provides an essential stepping stone to the specialist literature for each instrument and tech
丛书名称Springer Handbooks
图书封面Titlebook: Springer Handbook of Microscopy;  Peter W. Hawkes,John C. H. Spence Book 2019 Springer Nature Switzerland AG 2019 scanning electron microsc
描述.This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology..Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and alsoion microscopy. .In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and
出版日期Book 2019
关键词scanning electron microscopy, SEM; transmission electron microscopy, TEM; atomic force microscopy, AFM
版次1
doihttps://doi.org/10.1007/978-3-030-00069-1
isbn_ebook978-3-030-00069-1Series ISSN 2522-8692 Series E-ISSN 2522-8706
issn_series 2522-8692
copyrightSpringer Nature Switzerland AG 2019
The information of publication is updating

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发表于 2025-3-21 21:29:39 | 显示全部楼层
Cryo-Electron Tomographyata acquisition and data processing, including technology for focused ion beam milling, correlative light and electron microscopy, phase-plate imaging and direct electron detection. We show that these developments can be used synergistically to generate 3-D images of cells of unprecedented quality,
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Scanning Electron Microscopys instrument operation parameters for different samples as well as a discussion of the effects of electron-beam accelerating voltages on sample imaging, contrast, and resolution..More advanced topics are also included such as the use of beam deceleration and in-lens imaging and detectors. Analytical
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Variable Pressure Scanning Electron Microscopyional principles and signal composition of several detector classes are discussed..The gas ionization cascade also generates positive gaseous ions, which enable uncoated insulators to be imaged without resorting to the use of conductive coatings or low-voltage imaging. The principle of charge neutra
发表于 2025-3-22 09:16:24 | 显示全部楼层
Analytical Electron Microscopys and technologies of energy filters, monochromators, aberration correctors, and advanced energy-dispersive x-ray spectrometers. The different approaches of spectroscopic imaging with x-rays and energy-loss spectroscopy, the resolution limits, and the effects of electron-beam propagation are also de
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Ion Microscopy the chapter, a number of imaging modes will be discussed and selected examples will be presented. Finally, an outlook is presented on the ongoing efforts to add analytical capabilities to the method.
发表于 2025-3-22 22:31:44 | 显示全部楼层
Electron Holography. The advantages of using digital approaches to record and analyze electron holograms are highlighted. Finally, high-resolution electron holography, alternative modes of electron holography and future prospects for the development of the technique are briefly outlined.
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