Titlebook: Spectroscopic Ellipsometry for Photovoltaics; Volume 1: Fundamenta Hiroyuki Fujiwara,Robert W. Collins Book 2018 Springer International Pub

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Data Analysisht upon reflection from a sample surface. Data analysis enables determination of physical material properties of interest, such as film thickness, material dielectric functions, composition, crystallinity, conductivity, and more. This is achieved through model-based regression analysis. In this chap

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Ex Situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Siliconmultijunction thin film hydrogenated amorphous silicon (.-Si:H) based device structures deposited on flexible steel foil. This application demonstrates how PV specialists can adopt currently-available SE methodologies to assist in PV production line development, operation, and troubleshooting. Becau

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Crystalline Silicon Solar Cells solar cells are very efficient. As a result, the optical properties of silicon are extremely important in many aspects of solar cell manufacture, and have been determined by many groups using several techniques. The most reliable values of the optical functions of silicon have been determined using

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