| 书目名称 | Spectroscopic Ellipsometry for Photovoltaics |
| 副标题 | Volume 1: Fundamenta |
| 编辑 | Hiroyuki Fujiwara,Robert W. Collins |
| 视频video | |
| 概述 | Presents ellipsometry characterization of solar cell materials/devices.Provides easy-to-understand explanations of ellipsometry data analysis.Includes optical constants for all solar-cell component la |
| 丛书名称 | Springer Series in Optical Sciences |
| 图书封面 |  |
| 描述 | .This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community..The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.. |
| 出版日期 | Book 2018 |
| 关键词 | Amorphous Si solar cells; CIGS growth ananlysis; Compound solar cells; Hybrid perovskites; Microcrystall |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-319-75377-5 |
| isbn_ebook | 978-3-319-75377-5Series ISSN 0342-4111 Series E-ISSN 1556-1534 |
| issn_series | 0342-4111 |
| copyright | Springer International Publishing AG, part of Springer Nature 2018 |
发表于 2025-3-21 16:49:40
