| 书目名称 | Spectroscopic Ellipsometry for Photovoltaics |
| 副标题 | Volume 2: Applicatio |
| 编辑 | Hiroyuki Fujiwara,Robert W. Collins |
| 视频video | |
| 概述 | Presents the ellipsometry characterization of solar cell materials/devices.Provides easy-to-follow explanations of ellipsometry data analysis.Includes optical constants for all solar cell component la |
| 丛书名称 | Springer Series in Optical Sciences |
| 图书封面 |  |
| 描述 | .Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.. |
| 出版日期 | Book 2018 |
| 关键词 | Amorphous Si solar cells; CIGS growth ananlysis; Compound solar cells; Hybrid perovskites; Microcrystall |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-319-95138-6 |
| isbn_ebook | 978-3-319-95138-6Series ISSN 0342-4111 Series E-ISSN 1556-1534 |
| issn_series | 0342-4111 |
| copyright | Springer Nature Switzerland AG 2018 |
发表于 2025-3-21 19:09:58
