Titlebook: Soft Errors in Modern Electronic Systems; Michael Nicolaidis Book 2011 The Editor(s) (if applicable) and The Author(s) 2011

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Single Event Effects: Mechanisms and Classification,

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Circuit and System Level Single-Event Effects Modeling and Simulation,

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Integrated Circuit Qualification for Space and Ground-Level Applications: Accelerated Tests and Err

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Charles Slaymanessary. Nevertheless technicalities and detours should be avoided, and the presentation of mathematics should be just as free from emphasis on routine as from forbidding dogmatism which refuses to disclose moti978-1-4612-6570-2978-1-4612-0007-9

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Michael Nicolaidisor self-study by advanced undergraduate and graduate students and as a valuable reference for researchers in mathematics, physics, and engineering. One of the key strengths of this presentation, along with the 978-0-8176-8310-8

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Allan L. Silburt,Adrian Evans,Ana Burghelea,Shi-Jie Wen,David Ward,Ron Norrish,Dean Hogle,Ian Perrymor self-study by advanced undergraduate and graduate students and as a valuable reference for researchers in mathematics, physics, and engineering. One of the key strengths of this presentation, along with the 978-0-8176-8310-8

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0929-1296 rtsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business i978-1-4614-2689-9978-1-4419-6993-4Series ISSN 0929-1296