| 书目名称 | Soft Errors in Modern Electronic Systems | | 编辑 | Michael Nicolaidis | | 视频video | | | 概述 | Provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electron | | 丛书名称 | Frontiers in Electronic Testing | | 图书封面 |  | | 描述 | .This book provides a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques.. .The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry expertsin reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business i | | 出版日期 | Book 2011 | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4419-6993-4 | | isbn_softcover | 978-1-4614-2689-9 | | isbn_ebook | 978-1-4419-6993-4Series ISSN 0929-1296 | | issn_series | 0929-1296 | | copyright | The Editor(s) (if applicable) and The Author(s) 2011 |
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发表于 2025-3-21 16:34:42
