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Titlebook: Single-Photon Imaging; Peter Seitz,Albert JP Theuwissen Book 2011 Springer-Verlag Berlin Heidelberg 2011 CMOS image sensing.Charge coupled

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Image Sensor Technology,licon and which have the potential, like CCD and CIS devices before, to benefit from the integration made possible with silicon process technology. This chapter provides an introduction to the functionality of integrated image sensors. It presents the typical process flow and a discussion of where t
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Hybrid Avalanche Photodiode Array Imaging, combines a traditional phototube technology and an advanced semiconductor technology. A photon produces a photoelectron with quantum efficiency at the photocathode. Unlike a phototube with dynodes, multiplication of the photoelectron is provided by a bombardment of the accelerated photoelectron int
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Single-Photon Imaging Using Electron Multiplication in Vacuum,ily are photomultiplier tubes (PMT) and image intensifiers. During the past decades these devices lost ground to advanced solid state devices like APDs, low noise CMOS imagers, and EMCCDs. Can one expect solid state devices to totally replace vacuum based ones like digital photography replaced the f
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Monolithic Single-Photon Avalanche Diodes: SPADs,f the mechanisms underlying single-photon detection in highly complex integrated systems. This chapter begins with the fundamentals of avalanching, the basics for integration of avalanche photodiodes operating in Geiger-mode, and the issues associated with large arrays. We outline the techniques tha
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Single Photon CMOS Imaging Through Noise Minimization,the basic theory of CMOS image sensor photon detection. Then a discussion about additive noise systems and the sources of noise in CMOS image sensors is presented. Signal amplification and bandwidth control in low-noise CMOS image sensors are also discussed in detail. Then two complete architectures
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Low-Noise Electronic Imaging with Double-Gate FETs and Charge-Modulation Devices,CD introduces no transfer noise. However, conventional charge detectors incorporated into CCDs have a comparably large noise, which consists of thermal noise and 1/f noise from MOS transistor in the output charge detectors. Highly sensitive double gate charge detectors are presented in this chapter
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