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Titlebook: Single Event Phenomena; George C. Messenger,Milton S. Ash Book 1997 Springer Science+Business Media Dordrecht 1997 electronics.energy.phys

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书目名称Single Event Phenomena
编辑George C. Messenger,Milton S. Ash
视频video
图书封面Titlebook: Single Event Phenomena;  George C. Messenger,Milton S. Ash Book 1997 Springer Science+Business Media Dordrecht 1997 electronics.energy.phys
描述This monograph is written for neophytes, students, and practitioners to aid in their understanding of single event phenomena. It attempts to collect the highlights as well as many of the more detailed aspects of this field into an entity that portrays the theoretical as well as the practical applications of this subject. Those who claim that "theory" is not for them can skip over the earlier chapters dealing with the fundamental and theoretical portions and find what they need in the way of hands-on guidelines and pertinent formulas in the later chapters. Perhaps, after a time they will return to peruse the earlier chapters for a more complete rendition and appreciation of the subject matter. It is felt that the reader should have some acquaintance with the electronics of semiconductors and devices, some broad atomic physics introduction, as well as a respectable level of mathematics through calculus, including simple differential equations. A large part of the preceding can be obtained informally, through job experience, self-study, evening classes, as well as from a formal college curriculum.
出版日期Book 1997
关键词electronics; energy; physics; semiconductor
版次1
doihttps://doi.org/10.1007/978-1-4615-6043-2
isbn_softcover978-1-4613-7770-2
isbn_ebook978-1-4615-6043-2
copyrightSpringer Science+Business Media Dordrecht 1997
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Extraterrestrial SEU-Inducing Particles,cs. These particles include heavy cosmic ray ions of galactic origin. Other cosmic ray particles include the pion and muon groups of mesons. They are secondary particles produced by the interaction of incident cosmic rays with the earth’s atmosphere. Generally, the meson flux is greater than that of
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Single Event Upset Error Rates,rmulas for computing SEU in various particle environments. Section 5.2 discusses SEU calculations for heavy-ion cosmic rays at geosynchronous altitudes and Section 5.3 for Van Allen belt protons. Section 5.4 is on SEU-inducing neutrons at cruising altitudes for high-flying aircraft, and Section 5.5
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Single Event Phenomena I,and understand the basic concepts thereof. This chapter first discusses the process of funneling, which is of prime importance in the assessment of additional charge collected at the sensitive nodes of vulnerable devices. As can be appreciated, the charge collection dependencies of the device SEU-se
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Single Event Phenomena II,t single event upset (SEU)-inducing ion can produce more than one bit upset in the same memory array, for example. Following the above is a discussion of the effects of a device exposed to an ionizing dose of radiation prior to and/or during the occurrence of an SEU. The ionizing dose is usually con
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Single Event Upset Practice,t guidelines for use in practical applications. Besides understanding the basic tenets of the discipline of single event phenomena (SEP), it is felt important for the reader that they be transformed into useful expressions so as to obtain practical answers to important questions. Examples include th
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Single Event Upset: Experimental,dium and high mass number end of the periodic table, ionized, and highly energetic to reasonably simulate cosmic rays incident on spacecraft avionics. For these reasons, the simulation sources are primarily particle accelerators such as synchrotrons.
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