Titlebook: Sequential Logic Testing and Verification; Abhijit Ghosh,Srinivas Devadas,A. Richard Newton Book 1992 Springer Science+Business Media New

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Book 1992he problem has several aspects. Certainly, considering reliability implies that an engineer must be able to analyze how design decisions affect the incidence of failure. For instance, in order design reliable inte­ gritted circuits, it is necessary to analyze how decisions regarding design rules aff

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Test Generation Using RTL Descriptions,date, there is no known way of generating partial covers so that they can be made as effective as complete covers for test generation. Though the approach presented in Chapter 2 was shown to be more efficient than previous approaches, there is still a need for test generators that can handle large circuits, especially entire chips.

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Introduction,transistors, diodes, and other components such as resistors, capacitors, and interconnections within a very small area. The design of such circuits is a complicated and time consuming process. . refers to the process of (automatically) designing or re-designing a circuit from a specification of the

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Sequential Synthesis for Testability,hapters are used after the design is complete. Most circuits are designed with only area and performance under consideration, and quite often, the circuits are not fully or easily testable. Therefore, a significant amount of effort might be spent in generating tests for such circuits. Furthermore, d

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