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Titlebook: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy; A Laboratory Workboo Charles E. Lyman,Joseph I. Gold

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书目名称Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
副标题A Laboratory Workboo
编辑Charles E. Lyman,Joseph I. Goldstein,Klaus-Ruedige
视频video
图书封面Titlebook: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy; A Laboratory Workboo Charles E. Lyman,Joseph I. Gold
描述During the last four decades remarkable developments have taken place in instrumentation and techniques for characterizing the microstructure and microcomposition of materials. Some of the most important of these instruments involve the use of electron beams because of the wealth of information that can be obtained from the interaction of electron beams with matter. The principal instruments include the scanning electron microscope, electron probe x-ray microanalyzer, and the analytical transmission electron microscope. The training of students to use these instruments and to apply the new techniques that are possible with them is an important function, which. has been carried out by formal classes in universities and colleges and by special summer courses such as the ones offered for the past 19 years at Lehigh University. Laboratory work, which should be an integral part of such courses, is often hindered by the lack of a suitable laboratory workbook. While laboratory workbooks for transmission electron microscopy have-been in existence for many years, the broad range of topics that must be dealt with in scanning electron microscopy and microanalysis has made it difficult for ins
出版日期Book 1990
关键词X-ray; development; electron microscopy; microscopy
版次1
doihttps://doi.org/10.1007/978-1-4613-0635-1
isbn_softcover978-0-306-43591-1
isbn_ebook978-1-4613-0635-1
copyrightPlenum Press, New York 1990
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https://doi.org/10.1007/978-1-4613-0635-1X-ray; development; electron microscopy; microscopy
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978-0-306-43591-1Plenum Press, New York 1990
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Image Contrast and Qualitytors affecting the quality of the image and how they ultimately limit the image resolution, and (3) the effects of electronic signal processing on the visibility of features in the image. More details and references may be found in ., Chapters 3 and 4.
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Energy-Dispersive X-Ray Spectrometryy in the SEM lab. The purpose of this laboratory is to introduce the student to the basic concepts of energy-dispersive x-ray spectrometry and to examine some of the spectral artifacts inherent in the technique. More details and references can be found in ., Chapter 5.
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Environmental SEMressures will allow characterization of the various signal components available for imaging of insulators and water. Dynamic imaging of crystallization phenomena will be demonstrated using a cold stage.
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Basic SEM ImagingThis first laboratory is designed to acquaint the beginning SEM operator with the steps for taking a micrograph. The steps are described without reference to a particular instrument. Please consult the manufacturer’s operation manual or an instructor before proceeding.
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