Titlebook: Reviews of Plasma Physics; V. D. Shafranov Book 2003 Springer Science+Business Media New York 2003 Cross section.Plasma.collision.particle

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书目名称Reviews of Plasma Physics网络公开度学科排名




书目名称Reviews of Plasma Physics被引频次




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书目名称Reviews of Plasma Physics年度引用




书目名称Reviews of Plasma Physics年度引用学科排名




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书目名称Reviews of Plasma Physics读者反馈学科排名

指令

chronicle

Reviews of Plasma Physicshttp://image.papertrans.cn/r/image/829752.jpg

荣幸

https://doi.org/10.1007/978-1-4615-0027-8Cross section; Plasma; collision; particles; scattering

最有利

Asymptotic Theory of Charge Exchange and Mobility Processes for Atomic Ions, far from the atomic core. Third, if the electron transfer takes place between degenerated states of an atom and its ion, we find the mean cross section averaged over the electron-degenerated initial states of the colliding ion and atom, and this mean cross section pertains to a certain scheme of co

DRAFT

Plasma Models of Atom and Radiative-Collisional Processes,mon base. These include the interaction potentials of atoms with charged particles [1,2], photoionization cross sections of atoms [3, 4], static and dynamic polarizabilities [1, 5–8] and other properties.

Tincture

Book 2003 Atom and Radiative-Collisional Processes", by V.A. Astapenko, L.A. Bureyeva, V.S. Lisitsa, is devoted to a unified description of the atomic core polarization effects in the free-free, free-bound and bound-bound transitions of the charged particles in the field of multielectron atom..."Asymptotic T

畸形

Plasma Models of Atom and Radiative-Collisional Processes,ous advantage of these models is in their simplicity and versatility which allow the description of many properties of complex atoms and ions on a common base. These include the interaction potentials of atoms with charged particles [1,2], photoionization cross sections of atoms [3, 4], static and d

Traumatic-Grief

喧闹

0080-2050 he transport processes (mobility and diffusion coefficients) for ions in parent gases which are determined by resonant electron transfer. .978-1-4613-4890-0978-1-4615-0027-8Series ISSN 0080-2050 Series E-ISSN 1574-8952