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Titlebook: Reliability of Electronic Components; A Practical Guide to Titu I. Băjenescu,Marius I. Bâzu Book 1999 Springer-Verlag Berlin Heidelberg 199

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发表于 2025-3-21 17:59:36 | 显示全部楼层 |阅读模式
书目名称Reliability of Electronic Components
副标题A Practical Guide to
编辑Titu I. Băjenescu,Marius I. Bâzu
视频video
概述Application-oriented professional book.It provides engineers and students with enough background to design and analyse reliaility procedures.It also covers all the manufacturing aspects of electronic
图书封面Titlebook: Reliability of Electronic Components; A Practical Guide to Titu I. Băjenescu,Marius I. Bâzu Book 1999 Springer-Verlag Berlin Heidelberg 199
描述The first detailed studies of electronic components reliability were undertaken to improve the performance of communications and navigational systems used by the American army. The techniques then developed were subsequently refined and applied to equipment used for many other applications where high reliability was of paramount importance - for example in civil airline electronic systems. The evolution of good and reliable products is the responsibility of technical and professional persons, engineers and designers. These individuals cannot succeed unless they are given adequate opportunity to apply their arts and mysteries so as to bring the end-product to the necessary level of satisfaction. Few managements, however, are yet aware of the far greater potential value of the reliability of their products or services. Yet customer satisfaction depends, in most cases, far more on the reliability of performance than on quality in the industrial sense. There was a time when reliable design could be prescribed simply as "picking good parts and using them right". Nowadays the complexity of systems, particularly electronic systems, and the demand for ultrahigh reliability in many applicat
出版日期Book 1999
关键词CMOS; LED; Thyristor; Varistor; communication; development; integrated circuit; logic; optoelectronics; quali
版次1
doihttps://doi.org/10.1007/978-3-642-58505-0
isbn_softcover978-3-642-63625-7
isbn_ebook978-3-642-58505-0
copyrightSpringer-Verlag Berlin Heidelberg 1999
The information of publication is updating

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Reliability of diodes, diodes. Among the important characteristics that can’t be exceeded, the reverse voltage, the forward current and the maximum junction temperature (including data concerning the thermal resistance at high temperature) may be mentioned.
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Reliability of optoelectronic components,ed; however the main emphasis of this chapter will be the understanding of degradation processes in LEDs and optocouplers. In Fig.10.1 a classification of optoelectronic semiconductor components is given.
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Reliability of passive electronic parts,are used. Such failure analyses help in identifying device failure modes, mechanisms, and stress factors that influence degradation [3.1]. The . (infant mortality, or failure during the burn-in or debugging period) occur at high initial failure rate λ- which is the number of failures of a part per u
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Reliability of diodes,applied voltage [4.1]…[4.13]. The silicon is used almost exclusively as semiconductor material. The main constructive forms are planar diodes and MESA diodes. Among the important characteristics that can’t be exceeded, the reverse voltage, the forward current and the maximum junction temperature (in
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