| 书目名称 | Reliability Physics and Engineering | | 副标题 | Time-To-Failure Mode | | 编辑 | J.W. McPherson | | 视频video | | | 概述 | Provides basic Reliability Physics and Engineering tools for Electrical Engineers, Mechanical Engineers, Materials Scientists, and Applied Physicists to build better products.Includes information for | | 图书封面 |  | | 描述 | All engineers could bene?t from at least one course in reliability physics and engineering. It is very likely that, starting with your very ?rst engineering po- tion, you will be asked — how long is your newly developed device expected to last? This text was designed to help you to answer this fundamentally important question. All materials and devices are expected to degrade with time, so it is very natural to ask — how long will the product last? The evidence for material/device degradation is apparently everywhere in nature. A fresh coating of paint on a house will eventually crack and peel. Doors in a new home can become stuck due to the shifting of the foundation. The new ?nish on an automobile will oxidize with time. The tight tolerances associated with ?nely meshed gears will deteriorate with time. Critical parameters associated with hi- precision semiconductor devices (threshold voltages, drive currents, interconnect resistances, capacitor leakages, etc.) will degrade with time. In order to und- stand the lifetime of the material/device, it is important to understand the reliability physics (kinetics) for each of the potential failure mechanisms and then be able to develop | | 出版日期 | Textbook 20101st edition | | 关键词 | Burnin and Defect Elimination; Failure Rate Reduction; Time-To; Time-To-Failure Modeling; design; develop | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4419-6348-2 | | isbn_ebook | 978-1-4419-6348-2 | | copyright | Springer Science+Business Media, LLC 2010 |
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发表于 2025-3-21 18:26:32
