Titlebook: Reliability Physics and Engineering; Time-To-Failure Mode J. W. McPherson Textbook 20132nd edition Springer International Publishing Switze

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Time-to-Failure Modeling, to lose their . and become more ., . tend to . and .; etc. All devices (electrical, mechanical, electromechanical, biomechanical, bioelectrical, etc.) will tend to degrade with time and eventually fail.

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Gaussian Statistics: An Overview,g the time-zero values of a parameter (resistor values, mechanical tolerances, children heights, class grades on a test, etc.) can result in a distribution of values which can be described by a normal distribution.

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Conversion of Dynamical Stresses into Effective Static Values,ven when we discussed fatigue (a failure mechanism caused by a cyclical stress), it was assumed that the stress range Δσ remained constant with time. However, seldom is the applied stress constant with time, as illustrated in Fig. 1. In integrated circuits, the currents and fields are continually ch

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Increasing the Reliability of Device/Product Designs,can you make cost-effective design changes to improve the reliability robustness of the device? Often the designer will attempt to answer these questions by stating a safety factor χ which was used for a design..The safety factor, however, is only a qualitative indicator of the reliability margin of

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Screening,on is indeed a difficult/impossible challenge. Given that all devices will likely have a small fraction of the population which is defective, the question that we want to address in this chapter is: can a relatively .-. be used to eliminate the defective/weak devices without causing significant degr

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Sampling Plans and Confidence Intervals,lity inquiry is often expressed as: what is the defect level for the . of such devices in terms of number of defective devices per hundred, number of defective devices per thousand, number of defective devices per million (dpm), etc.? To determine the ., a sample of the devices is randomly selected

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ing and building reliable cost-effective products. The textbook contains numerous example problems with solutions. Included at the end of each chapter are exercise problems and answers. "Reliability Physics and Engineering" is a useful resource for students, engineers, and materials scientists.978-3-319-03329-7978-3-319-00122-7