Titlebook: Quantum Metrology and Fundamental Physical Constants; Paul H. Cutler,Amand A. Lucas Book 1983 Springer Science+Business Media New York 198

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Volkmar Kosealancing, migration cost, and resource overloading penalty. The MDP is solved by a reinforcement leaning (RL) approach. Specifically, a penalty-aware deep .-learning algorithm demonstrating advantages in reducing training loss and increasing cumulative reward is employed to learn the adaptive VNF mi

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S. Rameshrrounding the subway tunnel when the subway trains goes through. Besides the macroscopical study of the research object, the microstructure of soil was studied as well based on mercury intrusion porosimetry (MIP) and scanning electron microscopy (SEM). The former one provides access to quantitativel

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B. W. Petley were determined according to the ISO standard 12107. Moreover, an innovative approach based on the Maximum Likelihood Principle (MLP) was used to estimate the P-S-N curves as well as the endurance limit. Obtained results showed that the estimation made with the MLP, reduces the total time of the te

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Richard D. Deslattes be used as a tire tread. UV radiations are usually employed to change properties of the polymers, but there are very few examples of UV-curing effects applied to tires compound as well as the monitoring of properties over time using non-destructive techniques. In order to assess the compound viscoe

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Book 1983 needs for more accurate measurements and common standards in the emerging indus­ trial society. Although the concerns of metrology are deeply rooted to fundamental sciences, it was, until recently, perceived by much of the scientific community as mostly custodial in character.

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0258-1221 of growing needs for more accurate measurements and common standards in the emerging indus­ trial society. Although the concerns of metrology are deeply rooted to fundamental sciences, it was, until recently, perceived by much of the scientific community as mostly custodial in character.978-1-4899-2147-5978-1-4899-2145-1Series ISSN 0258-1221

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Quantized Hall Resistance and the Realization of the SI ohm Planck constant and e elementary charge)[1], using a novel quantum effect appearing on a macroscopic scale in MOSFETs. This method allows the first almost direct measurement of the fine structure constant α and makes it possible to reproduce and realize the unit of electrical resistance, the SI ohm, in a new way.