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Titlebook: Point Defects in Semiconductors and Insulators; Determination of Ato Johann-Martin Spaeth,Harald Overhof Book 2003 Springer-Verlag Berlin H

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书目名称Point Defects in Semiconductors and Insulators
副标题Determination of Ato
编辑Johann-Martin Spaeth,Harald Overhof
视频video
概述Includes supplementary material:
丛书名称Springer Series in Materials Science
图书封面Titlebook: Point Defects in Semiconductors and Insulators; Determination of Ato Johann-Martin Spaeth,Harald Overhof Book 2003 Springer-Verlag Berlin H
描述The precedent book with the title "Structural Analysis of Point Defects in Solids: An introduction to multiple magnetic resonance spectroscopy" ap­ peared about 10 years ago. Since then a very active development has oc­ curred both with respect to the experimental methods and the theoretical interpretation of the experimental results. It would therefore not have been sufficient to simply publish a second edition of the precedent book with cor­ rections and a few additions. Furthermore the application of the multiple magnetic resonance methods has more and more shifted towards materials science and represents one of the important methods of materials analysis. Multiple magnetic resonances are used less now for "fundamental" studies in solid state physics. Therefore a more "pedestrian" access to the meth­ ods is called for to help the materials scientist to use them or to appreciate results obtained by using these methods. We have kept the two introduc­ tory chapters on conventional electron paramagnetic resonance (EPR) of the precedent book which are the base for the multiple resonance methods. The chapter on optical detection of EPR (ODEPR) was supplemented by sections on the struc
出版日期Book 2003
关键词Density Functional Theory (DFT); Electrical Detection of EPR and ENDOR (EDEPR/EDENDOR); Electron Nucle
版次1
doihttps://doi.org/10.1007/978-3-642-55615-9
isbn_softcover978-3-642-62722-4
isbn_ebook978-3-642-55615-9Series ISSN 0933-033X Series E-ISSN 2196-2812
issn_series 0933-033X
copyrightSpringer-Verlag Berlin Heidelberg 2003
The information of publication is updating

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