找回密码
 To register

QQ登录

只需一步,快速开始

扫一扫,访问微社区

Titlebook: On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits; Qiang Cui,Juin J. Liou,Parthasarathy Srivatsan

[复制链接]
楼主: Suture
发表于 2025-3-25 04:10:33 | 显示全部楼层
Qiang Cui,Juin J. Liou,Parthasarathy SrivatsanDescribes in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies.Enables readers to design effective ESD protection solutions for
发表于 2025-3-25 09:59:51 | 显示全部楼层
发表于 2025-3-25 12:58:54 | 显示全部楼层
发表于 2025-3-25 17:32:52 | 显示全部楼层
978-3-319-35824-6Springer International Publishing Switzerland 2015
发表于 2025-3-25 21:08:52 | 显示全部楼层
es readers to design effective ESD protection solutions for This book enables readers to design effective ESD protection solutions for all mainstream RF fabrication processes (GaAs pHEMT, SiGe HBT, CMOS). The new techniques introduced by the authors have much higher protection levels and much lower
发表于 2025-3-26 04:11:25 | 显示全部楼层
发表于 2025-3-26 08:08:50 | 显示全部楼层
发表于 2025-3-26 10:00:01 | 显示全部楼层
发表于 2025-3-26 14:51:58 | 显示全部楼层
Book 2015ces. The authors describe in detail the ESD phenomenon, as well as ESD protection fundamentals, standards, test equipment, and basic design strategies. Readers will benefit from realistic case studies of ESD protection for RFICs and will learn to increase significantly modern RFICs’ ESD safety level, while maximizing RF performance.
发表于 2025-3-26 20:30:59 | 显示全部楼层
 关于派博传思  派博传思旗下网站  友情链接
派博传思介绍 公司地理位置 论文服务流程 影响因子官网 吾爱论文网 大讲堂 北京大学 Oxford Uni. Harvard Uni.
发展历史沿革 期刊点评 投稿经验总结 SCIENCEGARD IMPACTFACTOR 派博系数 清华大学 Yale Uni. Stanford Uni.
QQ|Archiver|手机版|小黑屋| 派博传思国际 ( 京公网安备110108008328) GMT+8, 2025-8-8 08:16
Copyright © 2001-2015 派博传思   京公网安备110108008328 版权所有 All rights reserved
快速回复 返回顶部 返回列表