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Titlebook: Nondestructive Evaluation of Semiconductor Materials and Devices; Jay N. Zemel Book 1979 Springer Science+Business Media New York 1979 mat

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Noise,ed a theoretical “limit of optimum performance”. Consequently the problem of evaluation has become of major importance and there is growing difficulty in determining the long term reliability of the devices.
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Lifetime Data Analysis,span determined by specified causes only. In the laboratory, lifetimes may arise from simulated service operation or operation under conditions deliberately different from service, usually more onerous. Still further, lifetimes may be measured on only an elementary part of a component.
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The Acoustic Microscope: A Tool for Nondestructive Testing,on has been developed, our understanding of the microscopic structure in nature has been extended. The introduction of acoustic radiation to microscopy can be expected to have a similar impact. This is the motivation underlying the development of the acoustic microscope.
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d out several devices in order to increase revenues for the Treasury and to help in economic development. The tax system, which had been designed between 1932 and 1946, crumbled, but no major fiscal reform was implemented. In spite of a rhetoric that emphasized Peronist corruption and deviant fiscal
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