Titlebook: Near-Field Nano-Optics; From Basic Principle Motoichi Ohtsu,Hirokazu Hori Book 1999 Springer Science+Business Media New York 1999 imaging.m

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Imaging Experiments,sional evanescent field on a sub wavelength object strongly depends on its size and topography. The approach of a sharpened probe tip to a single object with precise positioning enables one to obtain direct information about the evanescent field distribution with the sample—probe separation as a par

BILE

Diagnostics and Spectroscopy of Photonic Devices and Materials,ir study. In contrast, the NOM is indispensable for the study of semiconductor quantum structures. Take, for example, the case of a quantum dot. Using conventional optical techniques it is impossible to study the light output from a single quantum dot: What one sees is the superposition spectrum of

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尊重

Optical Near-Field Theory,vious chapters, NOM involves complicated optical processes consisting of subsystems of different characteristic scales of the electromagnetic interaction. In other words, in NOM both microscopic and macroscopic electromagnetic interactions play roles on the mesoscopic scale between atomic sizes and

碎石

Theoretical Description of Near-Field Optical Microscope,ultiple scattering of a vector field. The purpose is to examine the localization of the near-field interaction between small dielectric objects. Such a process is relevant to the near-field detection of near-field phenomena. We will show how we can obtain information about localized electromagnetic

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978-1-4613-7192-2Springer Science+Business Media New York 1999

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Lasers, Photonics, and Electro-Opticshttp://image.papertrans.cn/n/image/662308.jpg