Titlebook: Nanoscale Spectroscopy and Its Applications to Semiconductor Research; Yoshio Watanabe,Giancarlo Salviati,Naoki Yamamoto Conference procee

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Synchrotron Radiation X-ray Microscopy Based on Zone Plate Optics,tial of the x-ray microscopy for characterisation of laterally heterogeneous materials is illustrated using selected results obtained with the scanning photoelectron microscope at ELETTRA and the full-field imaging microscope at the European Synchrotron Radiation Facility (ESRF).

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ostracize

Surface Imaging Using Electrons Excited by Metastable-Atom Impacts,of organic semiconductor, chloroaluminum phthalocyanine (ClAlPc), on a MoS. surface. The latter result demonstrates that very large organic molecule can diffuse on the surface. For the ClAlPc film, the results obtained by photoemission electron microscopy (PEEM) using photons near the threshold ionization energy of the target are also shown.

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Photoelectron Spectroscopy with a Photoemission Electron Microscope,ven. The results of SPELEEM measurements from self-organized InAs nanocrystals are compared to conventional photoelectron spectral analyses. This comparison demonstrates that photoelectron spectroscopy with the SPELEEM is a reliable way to obtain information on the electronic structure of a sample from a sub-100 nm-sized area.

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Scanning Near-Field Optical Spectroscopy of Quantum-Confined Semiconductor Nanostructures,is paper we describe the experimental implementation of Near-Field Spectroscopy as well as its applications to the investigation of group-III nitride quantum dots samples and III-V quantum wires structures.

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CEDE

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