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Titlebook: Nanoscale Spectroscopy and Its Applications to Semiconductor Research; Yoshio Watanabe,Giancarlo Salviati,Naoki Yamamoto Conference procee

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书目名称Nanoscale Spectroscopy and Its Applications to Semiconductor Research
编辑Yoshio Watanabe,Giancarlo Salviati,Naoki Yamamoto
视频video
概述Includes supplementary material:
丛书名称Lecture Notes in Physics
图书封面Titlebook: Nanoscale Spectroscopy and Its Applications to Semiconductor Research;  Yoshio Watanabe,Giancarlo Salviati,Naoki Yamamoto Conference procee
描述Fabrication technologies for nanostructured devices have been developed recently, and the electrical and optical properties of such nanostructures are a subject of advanced research..This book describes the different approaches to spectroscopic microscopy, i.e., Electron Beam Probe Spectroscopy, Spectroscopic Photoelectron Microscopy, and Scanning Probe Spectroscopy. It will be useful as a compact source of reference for the experienced reseracher, taking into account at the same time the needs of postgraduate students and nonspecialist researchers by using a tutorial approach throughout.
出版日期Conference proceedings 2002
关键词Transit; electron microscope; electron microscopy; nanostructure; optics; quantum dot; sensor; spectroscopy
版次1
doihttps://doi.org/10.1007/3-540-45850-6
isbn_softcover978-3-662-14372-8
isbn_ebook978-3-540-45850-0Series ISSN 0075-8450 Series E-ISSN 1616-6361
issn_series 0075-8450
copyrightSpringer-Verlag Berlin Heidelberg 2002
The information of publication is updating

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Determination of Nanosize Particle Distribution by Low Frequency Raman Scattering: Comparison to Elndence of the Raman light of the vibration coupling coefficient .(.) and on the fact that each nanocrystalite of diameter . vibrates with its eigenfrequency . α 1/.. The effect of the particle vibrational lifetime on the shape of the distribution is analyzed and found to be negligible for free TiO.
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Strain Analysis in Submicron Electron Devices by Convergent Beam Electron Diffraction,an alysis of silicon nanoregions are described. Details on the procedure employed to obtain the components of the strainten sor from anexp erimental CBED patternare given. The CBED methodology has been recently applied to the analysis of straininthe field of microelectronics; as anexample, the inves
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Long-Term Oxidation Behaviour of Lead Sulfide Surfaces,r one year); and ‘clean’ (cleaved in air and inserted into the vacuum system within about 10 minutes). The elements detected on the surfaces were Pb, S, O, Cl (a natural impurity) and C (adventitious or natural, carbonate). Images showed strong topographic contrast and weak chemical contrast for the
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