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Titlebook: Nanoscale Probes of the Solid/Liquid Interface; Andrew A. Gewirth,Hans Siegenthaler Book 1995 Springer Science+Business Media Dordrecht 19

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书目名称Nanoscale Probes of the Solid/Liquid Interface
编辑Andrew A. Gewirth,Hans Siegenthaler
视频video
丛书名称NATO Science Series E:
图书封面Titlebook: Nanoscale Probes of the Solid/Liquid Interface;  Andrew A. Gewirth,Hans Siegenthaler Book 1995 Springer Science+Business Media Dordrecht 19
描述.Nanoscale Probes of the Solid--Liquid Interface. dealswith the use of the scanning tunnelling microscope (STM) and relatedinstrumentation to examine the phenomena occurring at the interfacebetween solid and liquid. .Scanning probe microscopy (the collective term for such instruments asthe STM, the atomic force microscope and related instrumentation)allows detailed, real space atomic or lattice scale insight intosurface structures, information which is ideally correlated withsurface reactivity. The use of SPM methods is not restricted toultrahigh vacuum: the STM and AFM have been used on samples immersedin solution or in ambient air, thus permitting a study ofenvironmental effects on surfaces. At the solid--liquid interface thereactivity derives precisely from the presence of the solution and, inmany cases, the application of an external potential. .Topics covered in the present volume include: the advantages ofstudying the solid--liquid interface and the obtaining of additionalinformation from probe measurements; interrelationships between probetip, the interface and the tunnelling process; STM measurements onsemiconductor surfaces; the scanning electrochemical microscope, AFMand
出版日期Book 1995
关键词AFM; STM; control; electrochemistry; measurement; metal
版次1
doihttps://doi.org/10.1007/978-94-015-8435-7
isbn_softcover978-90-481-4541-6
isbn_ebook978-94-015-8435-7Series ISSN 0168-132X
issn_series 0168-132X
copyrightSpringer Science+Business Media Dordrecht 1995
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Real-Space Imaging of Nanoscale Electrodeposited Ceramic Superlattices in the Scanning Tunneling Mies was shown to manifest itself as an apparent height profile in the STM image.. The STM helped us engineer “better” superlattices, since it was found that compositional superlattices grown under potential control had apparent height profiles which were more square than samples grown under current control.
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The Metal-Solution Interface in the STM-Configuration,different groups reporting widely different values under similar conditions. Other problems involve the effect of the STM tip on the electrostatic potential in its vicinity, and its influence on reactions such as metal deposition.
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Solid-Liquid: The Interface of the Future,onal phenomena of no lesser variety than those of the solid-vacuum interface in classical surface science. Moreover, the composition of the electrolyte brings an additional degree of freedom, reflected for example in the electrolyte-dependent reconstructions [1].
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In-Situ Scanning Tunneling Microscopy in Semiconductor Electrochemistry,ion is also examined, since surface states are important in semiconductor electrochemistry. A last section reviews some recent examples with an emphasis for in-situ real time STM imaging of Si etching and metal deposition on this material.
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Cluster Formation and Dissolution on Electrode Surfaces,of bulk copper, and discrepancies derived from this comparison are discussed. In addition, the oxidation of graphite at high positive potentials and the dynamics of morphological changes of the gold surface in the course of oxidation/reduction cycles are shown.
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