Titlebook: Microstructural Analysis; Tools and Techniques James L. McCall,William M. Mueller (Director of Ed Book 1973 Plenum Press, New York 1973 all

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Quantitative Stereology for Microstructural Analysis,al, and volume elements. By means of suitable two-dimensional measurements on the plane(s) of polish, statistically exact information can be obtained about the micro-structural features in the three-dimensional space occupied by the alloy. These geometrical relationships have great generality and ap

Obstreperous

Devices for Quantitative Analysis,ations of any random cross section of a uniform aggregate, many techniques and improved methods have been developed and applied to this endeavor. These improvements included both the mathematical means (2, 3) for describing and evaluating a given system as well as the equipment developed to actually

松驰

Scanning Electron Microscopy for Microstructural Analysis,nning electron microscope. Photographs taken with SEM’s have appeared widely in metallurgical literature and, in fact, it is not uncommon to see them in the daily newspapers or even in popular magazines. Perhaps the main reason for their wide use is that SEM images generally are easily recognizable;

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MELON

Microstructural Analysis and Fractography,servation using a scanning electron microscope has become a routine procedure in many metallurgical laboratories, and the techniques used in conducting such examinations are well documented, e.g., (1). Considerable literature has been devoted to the relationships existing between features found on t

ARC

Hallmark

Computers in Microstructural Analysis, devote our attention to a general discussion of “turn-key” computer/instrument systems which are supplied as part of a total analytical package by either an instrument manufacturer or an independent contractor who specializes in such developments. This sort of computer use is usually directed towar

浓缩

Use of Leed, Auger Emission Spectroscopy and Field Ion Microscopy in Microstructural Studies,the 10. to 10. torr range are commercially available. Thus, once a surface is cleaned, the researcher has adequate time to obtain information before a contaminant film can form. Accompanying these advances in obtaining low pressures in clean systems has been the development of analytic tools for exa

ANTH

Microstructural Studies Using the Electron Microprobe Analyzer,am were characterized by measuring their wavelength with a crystal spectrometer, he probably little realized the tremendous impact this technique would have on materials science. The idea was quickly adopted by other workers and Cosslett and Duncumb working in Britain added to Castaing’s stationary

Interlocking

Ion Probe Mass Spectrometry Analysis of Microstructures,e older techniques are incapable of satisfying all these demands. Current materials characterization problems are requiring that analytical instrumentation be capable of providing a wider and wider range of information about the sample, such as the following: