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Titlebook: Materials Fundamentals of Gate Dielectrics; Alexander A. Demkov,Alexandra Navrotsky Book 2005 Springer Science+Business Media B.V. 2005 Hi

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Rodney Mckeend the insidiously interconnected nature of so-called reforms. Thank you to Keith M. Sturges and colleagues for illuminating exactly this in their important and hard-hitting new book that reveals not merely how neoliberal reforms are designed to reinforce inequity, but also how the contradictions wi
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Y. Liang,A.A. Demkovnd the insidiously interconnected nature of so-called reforms. Thank you to Keith M. Sturges and colleagues for illuminating exactly this in their important and hard-hitting new book that reveals not merely how neoliberal reforms are designed to reinforce inequity, but also how the contradictions wi
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Matt Copelnd the insidiously interconnected nature of so-called reforms. Thank you to Keith M. Sturges and colleagues for illuminating exactly this in their important and hard-hitting new book that reveals not merely how neoliberal reforms are designed to reinforce inequity, but also how the contradictions wi
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Materials and Physical Properties of High-K Oxide Films,g many desirable properties, potential candidates must have a higher dielectric constant, low leakage current, and thermal stability against reaction or diffusion to ensure sharp interfaces with both the substrate Si and the gate metal (or poly-Si). Extensive characterization of such materials in th
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