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Titlebook: Low Pressure Plasmas and Microstructuring Technology; Gerhard Franz Book 20091st edition Springer-Verlag Berlin Heidelberg 2009 Cross sect

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High-frequency discharges II,coupling technique are widely used for plasma enhanced vapor deposition (PECVD) and for plasma and ion etching. They are introduced in Chaps. 10 and 11. The treatise will be on three different levels: in Sect. 6.1 on a qualitative level, in Sects. 6.2–6.6 on a semi-quantitative level, and in Sect. 1
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Ion beam systems,s) or partially separated as in the high-density reactors, which are spoken of “downstream”reactors. Spatial separation between plasma source and processing chamber leads to ion beam processing which was initially pushed by NASA at the end of the 1950s when they dreamt of interplanetary missions whi
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Plasma diagnostics, able to read the original literature. The second part is devoted to some results which are presented for high-frequency plasmas (CCPs, ICPs and whistler wave generated plasmas), especially discharges through electronegative gases.
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Etch Mechanisms,n methods? Does the surface (substrate electrode and reactor walls) influence the composition of the plasma bulk? Some important mechanisms, i. e. the kinetics of a reaction, will be discussed in detail.
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Outlook,0. Torr or 0.1 Pa to microwave operation which work even at atmospheric pressure] and operating frequencies [DC to MW operation (technical frequency: 2.45 GHz)]. Finer tuning leads to resonant methods (ECR and helicon) and non-resonant techniques (CCP and ICP). Concerning the type of etching, we dis
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Advanced Topics,lectrons and neutrals, elastic and inelastic ones. Since it describes the density of the electrons in the six-dimensional phase space of space and momentum, it is an equation of continuity of gain and loss and can be written as .. Its product . dr dv equals the number . of electrons within the volum
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