Titlebook: Lifetime Reliability-aware Design of Integrated Circuits; Mohsen Raji,Behnam Ghavami Book 2023 The Editor(s) (if applicable) and The Autho

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Mohsen Raji,Behnam GhavamiProvides an easy-to-follow procedure for analyzing lifetime reliability of nano-scale digital circuits.Describes state-of-the art aging- and process variation-aware CAD algorithms.Includes reliability

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Joint Timing Yield and Lifetime Reliability Optimization of Integrated Circuits,, in the second stage, we reduce the delay degradation induced by aging and process variations. To this end, two novel concepts, called aging probability and delay degradation-aware gate criticality, are introduced that enable us to perform gate sizing efficiently using an adaptive multiobjective ranking approach.

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Book 2023eliable VLSI circuits. In addition to developing lifetime reliability analysis and techniques for clocked storage elements (such as flip-flops), the authors also describe analysis and improvement strategies targeting commercial digital circuits.   .