Titlebook: Kelvin Probe Force Microscopy; From Single Charge D Sascha Sadewasser,Thilo Glatzel Book 2018 Springer International Publishing AG, part of

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Genistein

Dissipation Modulated Kelvin Probe Force Microscopy Methodce microscopy (FM-AFM) is used for dc bias voltage feedback (D-KPFM). The dissipation arises from an oscillating electrostatic force that is coherent with the tip oscillation, which is caused by applying the ac voltage between the tip and sample. The magnitude of the externally induced dissipation i

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THROB

Practical Aspects of Kelvin Probe Force Microscopy in Liquidsat nanometer scale in liquid media. While electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM) have routinely been used in vacuum and ambient conditions, they are not readily applicable in polar liquid media. In this chapter, we review the practical aspects of electrostatic

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Interpretation of KPFM Data with the Weight Function for Chargesach charge, depending on its position. In this chapter, we evaluate the KPFM weight function for charges by analyzing several application-relevant model systems. The intention of this chapter is to provide insights into the KPFM contrast formation in order to facilitate the KPFM data interpretation.

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感激小女

Quantitative Analysis of Kelvin Probe Force Microscopy on Semiconductorsere, we discuss the application of KPFM for the investigation of semiconducting materials, where the interpretation of KPFM is complicated by band bending and surface charge. Nevertheless, it is demonstrated that the signal measured with KPFM in semiconductors should be interpreted as the contact po

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