Titlebook: Kelvin Probe Force Microscopy; From Single Charge D Sascha Sadewasser,Thilo Glatzel Book 2018 Springer International Publishing AG, part of

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Dynamic Modes in Kelvin Probe Force Microscopy: Band Excitation and G-Modehe existing excitation schemes beyond the classical lock-in—feedback principle, and discuss at length the implementations and applications of KPFM based on band excitation and the full information capture embodied in general mode (G-Mode). The future potential pathways for development of detection i

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Quantitative Analysis of Kelvin Probe Force Microscopy on Semiconductorsates with a Fermi level dependent charge and surface states with fixed charge. It is demonstrated that the model calculations within the CPD model are consistent with experiments from the literature. As an example of how KPFM data on semiconductors can be analyzed, it is shown how information on sur

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Kelvin Probe Force Microscopy Characterization of Organic and Hybrid Perovskite Solar Cellsd extraction at the electrodes. This chapter will focus more specifically on KPFM investigations of the surface potential and surface photo-voltage of organic donor-acceptor interfaces and polycrystalline lead halide perovskites in relation with the sample morphology and structural defects at the me

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Kelvin Probe Force Microscopy with Atomic Resolutionugation in AM-KPFM is attributed to an artefact induced by the topographic feedback. Next, an investigation of the LCPD on a TiO. (110)-1 × 1 surface and atom-dependent bias-distance spectroscopic mapping are performed. The LCPD of TiO. (110) is dominated not only by the permanent surface dipole bet

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The Electrostatic Field of CO Functionalized Metal Tipsic lattice arises mainly from the CO electric field as the more extended field created by the metal apex averages out the contribution coming from those periodic and rapidly varying charge distributions. The insight gained from our analysis is used to address the apparent contradiction in the interp

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0931-5195 ents new and complementary topics..It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field..978-3-030-09298-6978-3-319-75687-5Series ISSN 0931-5195 Series E-ISSN 2198-4743

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