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Titlebook: Ion Beam Induced Defects and Their Effects in Oxide Materials; Parmod Kumar,Jitendra Pal Singh,K. Asokan Book 2022 The Author(s), under ex

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书目名称Ion Beam Induced Defects and Their Effects in Oxide Materials
编辑Parmod Kumar,Jitendra Pal Singh,K. Asokan
视频video
丛书名称SpringerBriefs in Physics
图书封面Titlebook: Ion Beam Induced Defects and Their Effects in Oxide Materials;  Parmod Kumar,Jitendra Pal Singh,K. Asokan Book 2022 The Author(s), under ex
描述.This book provides an overview of the applications of ion beam techniques in oxide materials. Oxide materials exhibit defect-induced physical properties relevant to applications in sensing, optoelectronics and spintronics. Defects in these oxide materials also lead to magnetism in non-magnetic materials or to a change of magnetic ordering in magnetic materials. Thus, an understanding of defects is of immense importance. To date, ion beam tools are considered the most effective techniques for producing controlled defects in these oxides. This book will detail the ion beam tools utilized for creating defects in oxides..
出版日期Book 2022
关键词Ion Irradiation; Defect creation; Ion Implantation; Oxide materials for sensing; Defects in Oxide Materi
版次1
doihttps://doi.org/10.1007/978-3-030-93862-8
isbn_softcover978-3-030-93861-1
isbn_ebook978-3-030-93862-8Series ISSN 2191-5423 Series E-ISSN 2191-5431
issn_series 2191-5423
copyrightThe Author(s), under exclusive license to Springer Nature Switzerland AG 2022
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https://doi.org/10.1007/978-3-030-93862-8Ion Irradiation; Defect creation; Ion Implantation; Oxide materials for sensing; Defects in Oxide Materi
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Swift Heavy Ion Irradiation,In this chapter, the basic introduction to the accelerator and its components along with the information related to material science beam line is presented.
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Summary and Future Prospective, A detailed information about ion beam interactions and ion beam-induced defects in oxide-based materials such as MgO, ZnO, TiO. and ZnFe.O. was presented and explored their potential applications. The summary and future perspective of the ion beam-induced modifications in oxide semiconductors are discussed in detail in this chapter.
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978-3-030-93861-1The Author(s), under exclusive license to Springer Nature Switzerland AG 2022
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