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Titlebook: Infrared Ellipsometry on Semiconductor Layer Structures; Phonons, Plasmons, a Mathias Schubert Book 2004 Springer-Verlag Berlin Heidelberg

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Infrared Model Dielectric Functions, the dielectric function due to polar lattice vibrations (phonons), impurity (lowpolarity) vibration modes, and free-charge-carrier plasma excitations are discussed. A condensed derivation for the classical anisotropic magneto-optic free-charge-carrier contribution is given.
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Polaritons in Semiconductor Layer Structures,nd plasmon-supported bulk polaritons. In addition, subtle effects are caused by interface modes (.) at which electromagnetic radiation is mediated parallel to the interfaces of thin-film structures. Precise information on phonon and plasmon mode parameters can be obtained from measurement and model
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Anisotropic Substrates,ric functions. Appropriate consideration of the anisotropic optical properties of noncubic substrate materials is the subject of the present chapter. The goal must be to determine the intrinsic dielectric functions to the most accurate level, because these functions will be incorporated during the b
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,4×4 Transfer Matrix T, for Isotropic Films,matrix formalism is necessary in order to include isotropic layers into layer models,which also include layers of anisotropic materials. The Berreman-formalism describes use of 4×4 matrices for calculation of reflection and transmission of electromagnetic plane waves by stratified mediums with plane
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TM Waves at Two Stratified Interfaces,. A similar search for TM modes as show in Appendix E for a single interface, directs to the dispersion relation for SP modes, which may now be bound to either side of the film. The line of derivation given here can easily be used for dissection of SP resonance conditions in heterostructures with mo
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