书目名称 | Infrared Ellipsometry on Semiconductor Layer Structures |
副标题 | Phonons, Plasmons, a |
编辑 | Mathias Schubert |
视频video | |
概述 | Describes a powerful new method for investigating semiconductor layer structures.Author is a leading expert in the field.Includes supplementary material: |
丛书名称 | Springer Tracts in Modern Physics |
图书封面 |  |
描述 | .The study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. ..A broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.. |
出版日期 | Book 2004 |
关键词 | Anisotropy; Blende; Free-charge carriers; HTS; Infrared ellipsometry; Polaritons; Semiconductor; ellipsomet |
版次 | 1 |
doi | https://doi.org/10.1007/b11964 |
isbn_softcover | 978-3-642-06228-5 |
isbn_ebook | 978-3-540-44701-6Series ISSN 0081-3869 Series E-ISSN 1615-0430 |
issn_series | 0081-3869 |
copyright | Springer-Verlag Berlin Heidelberg 2004 |