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Titlebook: Extraction of Semiconductor Diode Parameters; A Comparative Review Richard Ocaya Book 2024 The Editor(s) (if applicable) and The Author(s),

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https://doi.org/10.1007/978-3-322-88134-2llowing chapters. The focus is primarily on MSJ diodes since all solid-state devices involve such junctions. In the interest of presenting a more consistent discussion, the scope is focused on devices constructed on p-type silicon.
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Review of Metal-Semiconductor Junctions,llowing chapters. The focus is primarily on MSJ diodes since all solid-state devices involve such junctions. In the interest of presenting a more consistent discussion, the scope is focused on devices constructed on p-type silicon.
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Contemporary Parameter Extraction Methods,n suggested, with varying complexity and utility. Here, we present a cross-section of the most recent electrical methods devised over the last decade. The methods are divided into three broad categories. These are current-voltage methods, capacitance-voltage (impedance) methods, and transport methods.
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https://doi.org/10.1007/978-3-322-85737-8eries resistance calculations from this method exhibit rare agreement with the C–V method compared to the Cheung-Cheung method, accurately reproducing additional parameters like photo-conductive response and interface state density.
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A Novel Approach Based on Symmetry,eries resistance calculations from this method exhibit rare agreement with the C–V method compared to the Cheung-Cheung method, accurately reproducing additional parameters like photo-conductive response and interface state density.
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view of the field for researchers and engineers.Provides com.This book presents a comprehensive treatise on the extraction of semiconductor diode parameters using various methods. Its focus is on metal-semiconductor, metal-insulator-semiconductor, and p-n junction diodes, covering a wide range of me
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Book 2024uctor, metal-insulator-semiconductor, and p-n junction diodes, covering a wide range of metals and semiconductors, including elemental, compound, organic, and nanostructured materials. By bringing together these methods in one place, this book provides a much-needed standardized point of reference f
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Book 2024itical analysis, this book fills a large void in the field of semiconductor device characterization. It is an essential reference for anyone interested in the extraction of semiconductor diode parameters using a variety of methods. .
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