| 书目名称 | Extraction of Semiconductor Diode Parameters | | 副标题 | A Comparative Review | | 编辑 | Richard Ocaya | | 视频video | | | 概述 | Compares different parameter extraction methods to show strengths and weaknesses of each approach.Features a comprehensive and up-to-date review of the field for researchers and engineers.Provides com | | 图书封面 |  | | 描述 | .This book presents a comprehensive treatise on the extraction of semiconductor diode parameters using various methods. Its focus is on metal-semiconductor, metal-insulator-semiconductor, and p-n junction diodes, covering a wide range of metals and semiconductors, including elemental, compound, organic, and nanostructured materials. By bringing together these methods in one place, this book provides a much-needed standardized point of reference for the field...The methods used for device characterization have spread widely but not yet critically compared and contrasted. This book aims to bridge this gap by offering a comparative review of the methods and providing the most accurate information on current developments. The result is a valuable resource for researchers and practitioners who seek to optimize their use of semiconductor diodes in their work...With its thorough coverage and critical analysis, this book fills a large void in the field of semiconductor device characterization. It is an essential reference for anyone interested in the extraction of semiconductor diode parameters using a variety of methods. . | | 出版日期 | Book 2024 | | 关键词 | Schottky Junctions; Semiconductor Diode Parameters; Metal-Semiconductor Diodes; Metal-Insulator Diodes; | | 版次 | 1 | | doi | https://doi.org/10.1007/978-3-031-48847-4 | | isbn_softcover | 978-3-031-48849-8 | | isbn_ebook | 978-3-031-48847-4 | | copyright | The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerl |
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发表于 2025-3-21 18:19:44
