Titlebook: Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits; Michael L. Bushnell,Vishwani D. Agrawal Textbook 2002

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Textbook 2002which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester co

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Frontiers in Electronic Testinghttp://image.papertrans.cn/e/image/315632.jpg

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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits978-0-306-47040-0Series ISSN 0929-1296

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https://doi.org/10.1007/b117406Standard; VLSI; boundary scan; digital signal processor; drift transistor; integrated circuit; logic; model

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Philippe Henry,Philippe Nabonnandster. It is not possible to test MCMs at all without the boundary scan standard. The standard supports external testing with an ATE, and boundary scan chain reconfiguration as a pattern generator and response compressor for . (BIST.) The standard is beginning to get widespread usage.

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