| 书目名称 | Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits | | 编辑 | Michael L. Bushnell,Vishwani D. Agrawal | | 视频video | | | 丛书名称 | Frontiers in Electronic Testing | | 图书封面 |  | | 描述 | The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester co | | 出版日期 | Textbook 2002 | | 关键词 | Standard; VLSI; boundary scan; digital signal processor; drift transistor; integrated circuit; logic; model | | 版次 | 1 | | doi | https://doi.org/10.1007/b117406 | | isbn_softcover | 978-1-4757-8142-7 | | isbn_ebook | 978-0-306-47040-0Series ISSN 0929-1296 | | issn_series | 0929-1296 | | copyright | Springer Science+Business Media New York 2002 |
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发表于 2025-3-21 19:26:02
