| 书目名称 | Ellipsometry of Functional Organic Surfaces and Films |
| 编辑 | Karsten Hinrichs,Klaus-Jochen Eichhorn |
| 视频video | |
| 概述 | Provides a state of the art report of the technique of ellipsometry.Presents recent developments in ellipsometric real-time/in-situ monitoring techniques.Is oriented towards the high technological int |
| 丛书名称 | Springer Series in Surface Sciences |
| 图书封面 |  |
| 描述 | Ellipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years. |
| 出版日期 | Book 20141st edition |
| 关键词 | Biomolecules at Surfaces; Characterization of Organic Semiconductors for OPV,; Ellipsometric Real-time |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-642-40128-2 |
| isbn_softcover | 978-3-662-51020-9 |
| isbn_ebook | 978-3-642-40128-2Series ISSN 0931-5195 Series E-ISSN 2198-4743 |
| issn_series | 0931-5195 |
| copyright | Springer-Verlag Berlin Heidelberg 2014 |
发表于 2025-3-21 18:05:28
