Titlebook: Electron Microdiffraction; J. C. H. Spence,J. M. Zuo Book 1992 Springer Science+Business Media New York 1992 diffraction.electron.microsco

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The Measurement of Low-Order Structure Factors and Thickness, (1967, 1969), Goodman (1978), and Spence and Carpenter (1986). A recent review of structure factor measurement by electron diffraction can be found in Spence (1992c). Sections 4.5 and 4.6 discuss the significance of the measured charge density and of the zero-order Fourier coefficient of potential.

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Coherent Nanoprobes. STEM. Defects and Amorphous Materials,n of the sample by a plane wave) no longer gives rise to a point in the diffraction pattern (as for a perfect crystal), but rather will produce a diffuse streak of scattering. If the illumination is coherent, the streaks generated by adjacent source points must then be added coherently, and the resu

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or their encouragement and collaboration. At ASU, we owe a particular debt of gratitude to Professor M. O‘Keeffe for his encouragement. The depth of his under­ standing of crystal structures and his role as passionate skeptic have frequently been invaluable. Professor John Cowley has also been an invaluable s978-1-4899-2355-4978-1-4899-2353-0

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