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Titlebook: Electron Microdiffraction; J. C. H. Spence,J. M. Zuo Book 1992 Springer Science+Business Media New York 1992 diffraction.electron.microsco

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发表于 2025-3-21 16:56:39 | 显示全部楼层 |阅读模式
书目名称Electron Microdiffraction
编辑J. C. H. Spence,J. M. Zuo
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图书封面Titlebook: Electron Microdiffraction; J. C. H. Spence,J. M. Zuo Book 1992 Springer Science+Business Media New York 1992 diffraction.electron.microsco
描述Much of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. We are therefore grateful to Professors M. Ruhle and A. Seeger for acting as hosts during this time, and to the Alexander von Humbolt Foundation for the Senior Scientist Award which made this visit possible. The Ph. D. work of one of us (J. M. Z. ) has also provided much of the background for the book, together with our recent papers with various collaborators. Of these, perhaps the most important stimulus to our work on convergent-beam electron diffraction resulted from a visit to the National Science Foundation‘s Electron Microscopy Facility at Arizona State University by Professor R. H(lJier in 1988, and from a return visit to Trondheim by J. C. H. S. in 1990. We are therefore particularly grateful to Professor H(lJier and his students and co-workers for their encouragement and collaboration. At ASU, we owe a particular debt of gratitude to Professor M. O‘Keeffe for his encouragement. The depth of his under­ standing of crystal structures and his role as passionate skeptic have frequently been invaluable. Professor John Cowley has also been an invaluable s
出版日期Book 1992
关键词diffraction; electron; microscopy; Biological Microscopy
版次1
doihttps://doi.org/10.1007/978-1-4899-2353-0
isbn_softcover978-1-4899-2355-4
isbn_ebook978-1-4899-2353-0
copyrightSpringer Science+Business Media New York 1992
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The Geometry of CBED Patterns,ral (000) disk. This “calibration” information is needed for all the techniques described in the remaining sections of this book. A thorough grasp of the figures in this chapter is absolutely essential for any understanding of the CBED technique. Experience shows that few electron microscopists unde
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Symmetry Determination,rom nanometer-sized regions of crystal, the method has proven extremely useful, in combination with X-ray microanalysis, for identifying microphases in multiphase materials, and for the study of the symmetry changes which accompany phase transitions (Ecob ., 1981b). Review articles outlining the pro
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Instrumentation and Experimental Technique,croscope intended for microdiffraction work. Many of the instrumental requirements (particularly in the pole-piece region) will be found to be similar to those for energy-dispersive X-ray microanalysis. With the field-emission instruments used for the smallest probes, the need for a large tilting ra
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