Titlebook: Electron Energy-Loss Spectroscopy in the Electron Microscope; R. F. Egerton Book 19962nd edition Springer Science+Business Media New York

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Dror Lindner,Ron Gilat,Benjamin G. Dombith a specimen. This interaction may take place within a few atomic layers, as when a beam of low-energy (100–1000 eV) electrons is “reflected” from a solid surface. Because high voltages are not involved, the apparatus is relatively compact, but the low penetration depth implies the use of ultrahig

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Classification Using the Sonometer, a function of position (coordinates ., ., .) within the specimen and as a function of scattering angle (components .. and ..) and energy loss .. Even if technically feasible, such a procedure would involve storing a vast amount of information, so in practice the acquisition of energy-loss data is r

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Surgical Anatomy of the Hip Joint,on an empirical basis, the term . being taken to mean that the energy loss to the sample is less than some experimental resolution limit. Such a criterion results in electron scattering by phonon excitation being classified as elastic (or quasielastic) if measurements have been made using an electro

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Soshi Uchida,Dean K. Matsuda,Akinori Sakaical composition of a specimen. Although this information is expressed rather directly in the energy-loss spectrum, plural scattering complicates the data recorded from specimens of typical thickness. It is therefore desirable to remove the effects of plural scattering from the spectrum or at least m

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Tempor

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Soshi Uchida,Dean K. Matsuda,Akinori Sakaical composition of a specimen. Although this information is expressed rather directly in the energy-loss spectrum, plural scattering complicates the data recorded from specimens of typical thickness. It is therefore desirable to remove the effects of plural scattering from the spectrum or at least make allowance for them in the analysis procedure.

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COMMA

An Introduction to Electron Energy-Loss Spectroscopy,ith a specimen. This interaction may take place within a few atomic layers, as when a beam of low-energy (100–1000 eV) electrons is “reflected” from a solid surface. Because high voltages are not involved, the apparatus is relatively compact, but the low penetration depth implies the use of ultrahig

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