| 书目名称 | Electron Energy-Loss Spectroscopy in the Electron Microscope | | 编辑 | R. F. Egerton | | 视频video | | | 图书封面 |  | | 描述 | to the Second Edition Since the first (1986) edition of this book, the numbers of installations, researchers, and research publications devoted to electron energy-loss spec troscopy (EELS) in the electron microscope have continued to expand. There has been a trend towards intermediate accelerating voltages and field-emission sources, both favorable to energy-loss spectroscopy, and sev eral types of energy-filtering microscope are now available commercially. Data-acquisition hardware and software, based on personal computers, have become more convenient and user-friendly. Among university re searchers, much thought has been given to the interpretation and utilization of near-edge fine structure. Most importantly, there have been many practi cal applications of EELS. This may reflect an increased awareness of the potentialities of the technique, but in many cases it is the result of skill and persistence on the part of the experimenters, often graduate students. To take account of these developments, the book has been extensively revised (over a period of two years) and more than a third of it rewritten. I have made various minor changes to the figures and added about 80 new ones | | 出版日期 | Book 19962nd edition | | 关键词 | Analytical Electron Microscopy book; EELS materials science book; Inelastic scattering of electrons; co | | 版次 | 2 | | doi | https://doi.org/10.1007/978-1-4757-5099-7 | | isbn_ebook | 978-1-4757-5099-7 | | copyright | Springer Science+Business Media New York 1996 |
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发表于 2025-3-21 17:11:43
