Titlebook: Electron Energy-Loss Spectroscopy in the Electron Microscope; R.F. Egerton Book 2011Latest edition Springer Science+Business Media, LLC 20

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https://doi.org/10.1007/978-3-476-03429-8th a specimen. This interaction is sometimes confined to a few atomic layers, as when a beam of low-energy (100–1000 eV) electrons is “reflected” from a solid surface. Because high voltages are not involved, the apparatus is relatively compact but the low penetration depth implies the use of ultrahi

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https://doi.org/10.1007/978-1-4899-3220-4 term . meaning that any energy loss to the sample is not detectable experimentally. This criterion results in electron scattering by phonon excitation being classified as elastic (or quasielastic) when measurements are made using an electron microscope, where the energy resolution is rarely better

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Rehabilitation of Post-Operative Hipcimens, with the possibility of high spatial resolution. As in previous chapters, we begin with low-loss spectroscopy and energy filtering, followed by core-loss analysis and elemental mapping, including factors that determine detection sensitivity and spatial resolution. Structural information obta

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Hip Arthroscopy: Portal Placement200 keV, however, an additional effect starts to become important, representing the fact that the electrostatic interaction is “retarded” due to the finite speed of light. At high incident energies and for isotropic materials, Eq. (3.26) should be replaced by (Møller, 1932; Perez et al., 1977)

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Hip Arthroscopy: Portal Placement, are designed as a supplement to Digital Micrograph scripts (Mitchell and Schaffer, 2005) and can be downloaded from . or from ..All are written in MATLAB script. A program to convert DigitalMicrograph data files into MATLAB format is available. As these programs may be updated from time to time, th

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Kamal Bali,Stéphane Poitras,Sasha Carsen et al. (1967), Zaluzec (1981), Ahn and Krivanek (1983), and Colliex (1985). The most prominent edges (those most suitable for elemental analysis) are shown in italics. Where possible, an accompanying symbol is used to indicate the observed edge shape:

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Kenneth J. Koval,Joseph D. Zuckerman effective kinetic energy ., and the parameter 2. used to calculate the characteristic scattering angle .. = ./(2.). For values of .. not tabulated, these parameters can be calculated from the following equations:

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https://doi.org/10.1007/978-3-319-91304-9sing the information contained in inelastic scattering. An . provides much quantitative information, such as the local thickness (p. 293), chemical composition (p. 269, 324), and the crystallographic and electronic structure (Section 5.6) of a defined region of the specimen. . is more useful for sho