| 书目名称 | Electron Energy-Loss Spectroscopy in the Electron Microscope | | 编辑 | R.F. Egerton | | 视频video | | | 概述 | Considered the "Bible of EELS".Presents the only in-depth, single-author text for the still-expanding field of TEM-EELS.Responds to many requests for the first new edition of this classic work since 1 | | 图书封面 |  | | 描述 | .Within the last 30 years, electron energy-loss spectroscopy (EELS) has become a standard analytical technique used in the transmission electron microscope to extract chemical and structural information down to the atomic level. In two previous editions, .Electron Energy-Loss Spectroscopy in the Electron Microscope. has become the standard reference guide to the instrumentation, physics and procedures involved, and the kind of results obtainable. Within the last few years, the commercial availability of lens-aberration correctors and electron-beam monochromators has further increased the spatial and energy resolution of EELS. This thoroughly updated and revised Third Edition incorporates these new developments, as well as advances in electron-scattering theory, spectral and image processing, and recent applications in fields such as nanotechnology. The appendices now contain a listing of inelastic mean free paths and a description of more than 20 MATLAB programs for calculating EELS data.. | | 出版日期 | Book 2011Latest edition | | 关键词 | Analytical Electron Microscopy book; EELS materials science book; Inelastic scattering of electrons; Tr | | 版次 | 3 | | doi | https://doi.org/10.1007/978-1-4419-9583-4 | | isbn_softcover | 978-1-4899-8649-8 | | isbn_ebook | 978-1-4419-9583-4 | | copyright | Springer Science+Business Media, LLC 2011 |
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发表于 2025-3-21 17:11:25
