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Titlebook: Electron Backscatter Diffraction in Materials Science; Adam J. Schwartz,Mukul Kumar,David P. Field Book 2009Latest edition Springer-Verlag

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https://doi.org/10.1007/978-3-322-93000-2l the physical processes that lead to the formation of the characteristic diffraction features in the form of Kikuchi bands and lines. Whereas the purely geometrical relations in the observed networks of bands and lines can be explained by mapping out Bragg’s law for the relevant reflecting lattice
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Hans-Joachim Heintze,Knut Ipsenproperties. Electron backscatter diffraction (EBSD) dramatically enhances our abilities in this regard, by providing extensive crystallographic orientation information of a given two-dimensional section of a microstructure. As this technique has been developed and combined with chemical analysis and
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Die , Konstruktion oder Realität?sed to design engineering components and products. Phase identification and characterization are therefore critical to the development and use of practical materials. In this chapter, we will focus on the application of electron backscatter diffraction (EBSD) to phase identification.
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Foreign Policy of Heydar Aliyev,atures, the number of features, and the connectivity between these features. Experimental methods to characterize microstructure in 3D have undergone dramatic improvements in the past decade, and there now exists a host of methodologies that are capable of determining 3D microstructural information,
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Ciro Andolfi M.D.,Marco P. Fisichella M.D.’ response. Often, the use of simple average quantities such as “grain size” is inadequate; instead one may need to consider the possibility that the full three-dimensional (3D) microstructure is important. Calculations by hand being self-evidently impracticable, computers must be used, and thus a d
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Inheritance and Custom Mapping,k for establishing invertible linkages between the mesoscale internal structure of the material and the macroscale properties exhibited by the material. It is noted that the current practice in engineering design does not pay adequate attention to the internal structure of the material as a continuo
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,Cultivating “No Bossing” Leadership,d in many different ways. The most common metrics of structure involve “first-order” (volume fraction) information: for example, the orientation distribution function. Such metrics serve well as the basis for property relations that do not depend significantly upon the geometrical placement of the m
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