找回密码
 To register

QQ登录

只需一步,快速开始

扫一扫,访问微社区

Titlebook: Electron Backscatter Diffraction in Materials Science; Adam J. Schwartz,Mukul Kumar,David P. Field Book 2009Latest edition Springer-Verlag

[复制链接]
查看: 21271|回复: 62
发表于 2025-3-21 16:57:43 | 显示全部楼层 |阅读模式
书目名称Electron Backscatter Diffraction in Materials Science
编辑Adam J. Schwartz,Mukul Kumar,David P. Field
视频video
概述Brings together a collection of approximately 25 chapters written by experts in the field.Provides everything a researcher needs to enter and succeed in the field of electron backscatter diffraction.I
图书封面Titlebook: Electron Backscatter Diffraction in Materials Science;  Adam J. Schwartz,Mukul Kumar,David P. Field Book 2009Latest edition Springer-Verlag
描述.Electron backscatter diffraction is a very powerful and relatively new materials characterization technique aimed at the determination of crystallographic texture, grain boundary character distributions, lattice strain, phase identification, and much more. The purpose of this book is to provide the fundamental basis for electron backscatter diffraction in materials science, the current state of both hardware and software, and illustrative examples of the applications of electron backscatter diffraction to a wide-range of materials including undeformed and deformed metals and alloys, ceramics, and superconductors...The text has been substantially revised from the first edition, and the authors have kept the format as close as possible to the first edition text. The new developments covered in this book include a more comphrensive coverage of the fundamentals not covered in the first edition or other books in the field, the advances in hardware and software since the first edition was published, and current examples of application of electron backscatter diffraction to solve challenging problems in materials science and condensed-matter physics..
出版日期Book 2009Latest edition
关键词EBSD explained; backscattered electron generation; crystallography; elastic strains; electron microscope
版次2
doihttps://doi.org/10.1007/978-0-387-88136-2
isbn_softcover978-1-4899-9334-2
isbn_ebook978-0-387-88136-2
copyrightSpringer-Verlag US 2009
The information of publication is updating

书目名称Electron Backscatter Diffraction in Materials Science影响因子(影响力)




书目名称Electron Backscatter Diffraction in Materials Science影响因子(影响力)学科排名




书目名称Electron Backscatter Diffraction in Materials Science网络公开度




书目名称Electron Backscatter Diffraction in Materials Science网络公开度学科排名




书目名称Electron Backscatter Diffraction in Materials Science被引频次




书目名称Electron Backscatter Diffraction in Materials Science被引频次学科排名




书目名称Electron Backscatter Diffraction in Materials Science年度引用




书目名称Electron Backscatter Diffraction in Materials Science年度引用学科排名




书目名称Electron Backscatter Diffraction in Materials Science读者反馈




书目名称Electron Backscatter Diffraction in Materials Science读者反馈学科排名




单选投票, 共有 1 人参与投票
 

0票 0.00%

Perfect with Aesthetics

 

0票 0.00%

Better Implies Difficulty

 

1票 100.00%

Good and Satisfactory

 

0票 0.00%

Adverse Performance

 

0票 0.00%

Disdainful Garbage

您所在的用户组没有投票权限
发表于 2025-3-21 23:55:45 | 显示全部楼层
发表于 2025-3-22 02:20:24 | 显示全部楼层
978-1-4899-9334-2Springer-Verlag US 2009
发表于 2025-3-22 07:37:48 | 显示全部楼层
发表于 2025-3-22 09:45:41 | 显示全部楼层
E. Deutsch,K. Irsigler,O. KrauppConventional EBSD-based orientation microscopy is a 2-dimensional (2D) characterization method, which is applied to plane cuts through a sample. Statistical stereological techniques can be used to gain insight into the 3D aspects of microstructure, as in, e.g., Adams (1986), Adams et al.
发表于 2025-3-22 15:39:00 | 显示全部楼层
发表于 2025-3-22 20:22:14 | 显示全部楼层
Spherical Kikuchi Maps and Other Rarities,Spheres, or more accurately, spherical surfaces, are important for electron backscatter diffraction (EBSD). Electron backscatter patterns (EBSPs) and pole figure and misorientation axis data are ideally suited to display on the surface of a sphere.
发表于 2025-3-23 00:29:26 | 显示全部楼层
Three-Dimensional Orientation Microscopy by Serial Sectioning and EBSD-Based Orientation Mapping inConventional EBSD-based orientation microscopy is a 2-dimensional (2D) characterization method, which is applied to plane cuts through a sample. Statistical stereological techniques can be used to gain insight into the 3D aspects of microstructure, as in, e.g., Adams (1986), Adams et al.
发表于 2025-3-23 03:10:32 | 显示全部楼层
发表于 2025-3-23 05:59:49 | 显示全部楼层
Heute akquirieren - sofort profitierendividual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routinely on the surfaces of bulk polycrystals. The application has experienced rapid acceptance in metallurgical, materials, and geophysical laboratories
 关于派博传思  派博传思旗下网站  友情链接
派博传思介绍 公司地理位置 论文服务流程 影响因子官网 SITEMAP 大讲堂 北京大学 Oxford Uni. Harvard Uni.
发展历史沿革 期刊点评 投稿经验总结 SCIENCEGARD IMPACTFACTOR 派博系数 清华大学 Yale Uni. Stanford Uni.
|Archiver|手机版|小黑屋| 派博传思国际 ( 京公网安备110108008328) GMT+8, 2025-5-26 10:15
Copyright © 2001-2015 派博传思   京公网安备110108008328 版权所有 All rights reserved
快速回复 返回顶部 返回列表