Titlebook: Electromigration Inside Logic Cells; Modeling, Analyzing Gracieli Posser,Sachin S. Sapatnekar,Ricardo Reis Book 2017 Springer Internationa

Cognizance

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Irascible

Gracieli Posser,Sachin S. Sapatnekar,Ricardo ReisProvides a comprehensive overview of signal electromigration analysis and modeling within logic cells, along with mitigation methodologies.Presents an algorithm to optimize the lifetime of circuits by

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Pastry

虚弱的神经

Eduard Wellacher,Helmuth KuscherElectromigration (EM) is a major source of failure in on-chip metal interconnects and vias and is becoming a progressively increasing concern as technology feature sizes shrink.

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Conducive

Hermann Minkowski Briefe an David HilbertThis chapter presents how the average and RMS current values are calculated to model the EM effects in this work. ..

积习难改

Introduction,Electromigration (EM) is a major source of failure in on-chip metal interconnects and vias and is becoming a progressively increasing concern as technology feature sizes shrink.