Titlebook: EMC 2008; Vol 1: Instrumentati Martina Luysberg,Karsten Tillmann,Thomas Weirich Conference proceedings 20081st edition Springer-Verlag Berl

GRAZE

Aberration corrected STEM and EELS: Atomic scale chemical mappingrom the principle of reciprocity, the STEM resolution should be at least as good as the TEM resolution for the same objective lens. Lattice resolution high angle annular dark field (HAADF) STEM images are now a much more routine part of the analytical arsenal applied to materials characterisation.

peak-flow

gustation

淡紫色花

So sehen wir die Sache: Fallstudien,enable new types of experiments. The TEAM microscope will feature unique corrector elements for spherical and chromatic aberrations, a novel AFM-inspired specimen stage, a high-brightness gun and numerous other innovations that will extend resolution down to the half-Angstrom level.

俗艳

联想

强化

Synchrotron based X-ray Microscopy: state of the art and applicationstron based analytical techniques (diffraction, imaging and micro-spectroscopies) will play an important role by offering unique capabilities in the study of complex systems. Ultimately, this complexity can be envisioned in three dimensions: composition, time and space.

大雨

stress-test

Extemporize