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Titlebook: EMC 2008; Vol 1: Instrumentati Martina Luysberg,Karsten Tillmann,Thomas Weirich Conference proceedings 20081st edition Springer-Verlag Berl

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书目名称EMC 2008
副标题Vol 1: Instrumentati
编辑Martina Luysberg,Karsten Tillmann,Thomas Weirich
视频video
图书封面Titlebook: EMC 2008; Vol 1: Instrumentati Martina Luysberg,Karsten Tillmann,Thomas Weirich Conference proceedings 20081st edition Springer-Verlag Berl
描述.Proceedings of the14th European Microscopy Congress, held in Aachen, Germany, 1-5 September 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three major areas of instrumentation and methods, materials science and life science..
出版日期Conference proceedings 20081st edition
关键词calculus; electron; electron microscopy; electron optics; microscopy; optics; scanning electron microscopy
版次1
doihttps://doi.org/10.1007/978-3-540-85156-1
isbn_softcover978-3-662-50225-9
isbn_ebook978-3-540-85156-1
copyrightSpringer-Verlag Berlin Heidelberg 2008
The information of publication is updating

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978-3-662-50225-9Springer-Verlag Berlin Heidelberg 2008
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Conference proceedings 20081st editiony (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the three majo
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opy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress brings together scientists from Europe and from all over the world. The scientific programme covers all recent developments in the
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https://doi.org/10.1007/978-981-15-8006-2rom the principle of reciprocity, the STEM resolution should be at least as good as the TEM resolution for the same objective lens. Lattice resolution high angle annular dark field (HAADF) STEM images are now a much more routine part of the analytical arsenal applied to materials characterisation.
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