Titlebook: Diffraction Analysis of the Microstructure of Materials; Eric J. Mittemeijer,Paolo Scardi Book 2004 Springer-Verlag Berlin Heidelberg 2004

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0933-033X ns, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves. .978-3-642-07352-6978-3-662-06723-9Series ISSN 0933-033X Series E-ISSN 2196-2812

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Full Profile Analysis of X-ray Diffraction Patterns for Investigation of Nanocrystalline Systemsarameters, enables us to obtain quantitative information on the real structure of the nanocrystalline systems. The results of the real structure study of some practically important nanomaterials such as oxides, carbon materials, metals and alloys are also described.

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Diffraction Elastic Constants and Stress Factors; Grain Interaction and Stress in Macroscopically El

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