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Titlebook: Diffraction Analysis of the Microstructure of Materials; Eric J. Mittemeijer,Paolo Scardi Book 2004 Springer-Verlag Berlin Heidelberg 2004

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发表于 2025-3-21 20:03:07 | 显示全部楼层 |阅读模式
书目名称Diffraction Analysis of the Microstructure of Materials
编辑Eric J. Mittemeijer,Paolo Scardi
视频video
概述The diffraction analysis is a powerful tool to characterize the microstructure, dislocations, interfaces and surfaces of microstructured materials and thin films..This book presents the method, theory
丛书名称Springer Series in Materials Science
图书封面Titlebook: Diffraction Analysis of the Microstructure of Materials;  Eric J. Mittemeijer,Paolo Scardi Book 2004 Springer-Verlag Berlin Heidelberg 2004
描述.Diffraction Analysis of the Microstructure of Materials. provides an overview of diffraction methods applied to the analysis of the microstructure of materials. Since crystallite size and the presence of lattice defects have a decisive influence on the properties of many engineering materials, information about this microstructure is of vital importance in developing and assessing materials for practical applications. The most powerful and usually non-destructive evaluation techniques available are X-ray and neutron diffraction. The book details, among other things, diffraction-line broadening methods for determining crystallite size and atomic-scale strain due, e.g. to dislocations, and methods for the analysis of residual (macroscale) stress. The book assumes only a basic knowledge of solid-state physics and supplies readers sufficient information to apply the methods themselves. .
出版日期Book 2004
关键词Diffraction Analysis; Dislocation; Helium-Atom-Streuung; Interface and Surface Effects; Powder diffracti
版次1
doihttps://doi.org/10.1007/978-3-662-06723-9
isbn_softcover978-3-642-07352-6
isbn_ebook978-3-662-06723-9Series ISSN 0933-033X Series E-ISSN 2196-2812
issn_series 0933-033X
copyrightSpringer-Verlag Berlin Heidelberg 2004
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Convolution Based Profile Fittingneral convolution approach to X-ray and neutron powder data is described, which can accurately convolute and refine a wide variety of profile shapes numerically, including user defined profiles, without the need to convolute analytically. With functions representing both the aberration functions of
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Full Profile Analysis of X-ray Diffraction Patterns for Investigation of Nanocrystalline Systemsr their structural investigation, two approaches for the full profile analysis of X-ray powder diffraction patterns are proposed. Use of the first one (the modified Rietveld algorithm) allows us to refine the average atomic structure parameters, including the atomic coordinates, the Debye—Waller fac
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Quantitative Analysis of Amorphous Fraction in the Study of the Microstructure of Semi-crystalline Mnal standard is described and some applications are reported. Although the applicability of this method is not as wide as the internal standard one, it represents a valid alternative when the standard cannot be added to the sample, e.g. in bulk materials. This method can only be applied if the chemi
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Study of Submicrocrystalline Materials by Diffuse Scattering in Transmitted Wavethod is based on the measurement of the small-angle diffuse scattering in the transmitted wave and requires thin foil samples and well-defined incoming plane wave. The physical information is encoded in the wave modification due to primary extinction in the crystallites.
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